Imaging organic device function with near-field scanning optical microscopy

被引:33
作者
McNeill, JD [1 ]
O'Connor, DB [1 ]
Barbara, PF [1 ]
机构
[1] Univ Texas, Dept Chem & Biochem, Austin, TX 78712 USA
关键词
D O I
10.1063/1.481386
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Recent developments in the use of near-field scanning optical microscopy-based techniques to monitor and image physical processes related to device function in thin film organic materials are surveyed. By combining subwavelength optical probes with electro-optical spectroscopic techniques, methods have been developed for measuring the dynamics, spatial variation, and diffusion of energy and charge carriers in organic electro-optical devices. Materials investigated include polymer thin films, polycrystalline and amorphous (glassy) organic films, liquid crystalline materials, and molecular semiconductor heterostructures. (C) 2000 American Institute of Physics. [S0021-9606(00)70416-8].
引用
收藏
页码:7811 / 7821
页数:11
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