Time-resolved photoluminescence spectroscopy in GaN-based semiconductors with micron spatial resolution

被引:31
作者
Izumi, T [1 ]
Narukawa, Y
Okamoto, K
Kawakami, Y
Fujita, S
Nakamura, S
机构
[1] Kyoto Univ, Dept Elect Sci & Engn, Kyoto 6068501, Japan
[2] Kyoto Univ, Venture Business Lab, Kyoto 6068501, Japan
[3] Nichia Chem Ind Ltd, Dept Res & Dev, Tokushima 7748601, Japan
关键词
spatial and time-resolved spectroscopy; ELO-GaN; threading dislocation; nonradiative process;
D O I
10.1016/S0022-2313(99)00594-3
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Recombination dynamics in GaN-based layers have been studied by means of photoluminescence spectroscopy having spectral and spatial resolution. It was found that PL lifetime (tau(PL)) Of the epitaxially laterally overgrown GaN (ELO-GaN), which consists of the regions with high (window) and low (wing) threading dislocation density (DD), was dominated by the nonradiative recombination process at room temperature (RT), and that the tau(PL). measured at wing region (DD = 10(6) cm(-2)) was 86 ps which is slightly larger than the value (70 ps) at window region (DD = 10(8) cm(-2)). These indicate that threading dislocations limit hardly the emission efficiency even with these DD-levels, and that the device performance is mainly limited by other types of nonradiative recombination centers. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1196 / 1198
页数:3
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