In-situ polarized neutron reflectivity of ultrathin epitaxial Fe layers on V(110)

被引：8

作者：

Nawrath, T

Fritzsche, H

Klose, F

Nowikow, J

Polaczyk, C

Maletta, H

机构：

[1] Hahn-Meitner-Institut Berlin, D-14109 Berlin

来源：

PHYSICA B | 1997年 / 234卷

关键词：

reflectometry; polarized neutrons; thin films; ferromagnetism;

D O I：

10.1016/S0921-4526(96)01026-5

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We have investigated magnetic properties of thin Fe layers epitaxially grown on a V(110) single crystal in an in-situ experiment by neutron reflectivity. The low interaction of the neutrons with the V substrate allows to determine the absolute magnetic moment of the uncovered films of monolayer thickness. The Fe films clearly show ferromagnetic ordering down to 5 ML thickness, whereas for a 3 ML film no in-plane magnetization is found even at a temperature of 80 K.

引用

页码：505 / 507

页数：3

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