Resolving the geometrically necessary dislocation content by conventional electron backscattering diffraction

被引：715

作者：

Pantleon, W. ^{[1
]}

机构：

[1] Tech Univ Denmark, Riso Natl Lab, Dept Mat Res, Ctr Fundamental Res Met Struct Dimens 4, DK-4000 Roskilde, Denmark

来源：

SCRIPTA MATERIALIA | 2008年 / 58卷 / 11期

关键词：

microstructure; dislocation structure; electron backscattering diffraction (EBSD); disorientation;

D O I：

10.1016/j.scriptamat.2008.01.050

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

From local orientation measurements on planar surfaces by means of electron backscattering diffraction, six components of the lattice curvature tensor can be identified. They allow determination of five components of the dislocation density tensor (thus two more than hitherto reported) and, additionally, one difference between two other components. With this information improved lower bounds for the geometrically necessary dislocation content are obtained by linear optimization. (c) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：994 / 997

页数：4

共 13 条

[1]

BUNGE HJ, 1993, TEXTURE ANAL MAT SCI, P1

[2] Viewpoint: experimental recovery of geometrically necessary dislocation density in polycrystals [J].

El-Dasher, BS ;

Adams, BL ;

Rollett, AD .

SCRIPTA MATERIALIA, 2003, 48 (02) :141-145

[3] Analysis of local orientation gradients in deformed single crystals [J].

Field, DP ;

Trivedi, PB ;

Wright, SI ;

Kumar, M .

ULTRAMICROSCOPY, 2005, 103 (01) :33-39

[4]

HE W, IN PRESS MAT SCI ENG

[5] DER FUNDAMENTALE ZUSAMMENHANG ZWISCHEN VERSETZUNGSDICHTE UND SPANNUNGSFUNKTIONEN [J].

KRONER, E .

ZEITSCHRIFT FUR PHYSIK, 1955, 142 (04) :463-475

[6]

KRONER E, 1981, PHYSICS DEFECTS, P219

[7] SOME GEOMETRICAL RELATIONS IN DISLOCATED CRYSTALS [J].

NYE, JF .

ACTA METALLURGICA, 1953, 1 (02) :153-162

[8]

PANTLEON W, 2005, MAT SCI TECHNOL, V21, P1391

[9]

PANTLEON W, IN PRESS MAT SCI ENG

[10]

SCHWARZ AJ, 2000, ELECT BACKSCATTER DI

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