Market price of risk specifications for affine models: Theory and evidence

被引:132
作者
Cheridito, Patrick
Filipovic, Damir
Kimmel, Robert L. [1 ]
机构
[1] Ohio State Univ, Fisher Coll Business, Columbus, OH 43210 USA
[2] Princeton Univ, Dept Operat Res & Financial Engn, Princeton, NJ 08544 USA
[3] Univ Munich, Dept Math, D-80333 Munich, Germany
关键词
term structure; market price of risk; affine yield models; no-arbitrage pricing;
D O I
10.1016/j.jfineco.2005.09.008
中图分类号
F8 [财政、金融];
学科分类号
0202 ;
摘要
We extend the standard specification of the market price of risk for affine yield models, and apply it to U.S. Treasury data. Our specification often provides better fit, sometimes with very high statistical significance. The improved fit comes from the time-series rather than cross-sectional features of the yield curve. We derive conditions under which our specification does not admit arbitrage opportunities. The extension has extremely strong statistical significance For affine yield models with multiple square-root type variables. Although we focus on affine yield models, our specification can be used with other asset pricing models as well. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:123 / 170
页数:48
相关论文
共 35 条
[1]  
Ait-Sahalia Y., 2005, NBER WORKING PAPER
[2]  
AITSAHALIA Y, 2001, CLOSED FORM LIKELIHO
[3]  
Balduzzi P., 1996, J FIXED INCOME, V6, P43
[4]   Jumps and stochastic volatility: Exchange rate processes implicit in deutsche mark options [J].
Bates, DS .
REVIEW OF FINANCIAL STUDIES, 1996, 9 (01) :69-107
[5]  
Beaglehole DR., 1991, J FIXED INCOME, V1, P69, DOI 10.3905/jfi.1991.408014
[6]  
BLISS RR, 1997, ADV FUTURES OPTIONS
[7]   Simulated likelihood estimation of diffusions with an application to exchange rate dynamics in incomplete markets [J].
Brandt, MW ;
Santa-Clara, P .
JOURNAL OF FINANCIAL ECONOMICS, 2002, 63 (02) :161-210
[8]  
BRANDT MW, 2002, SIMULATED LIKELIHOOD
[9]  
Chen L., 1996, Financ. Mark. Inst. Instrum., V5, P1
[10]   Equivalent and absolutely continuous measure changes for jump-diffusion processes [J].
Cheridito, P ;
Filipovic, D ;
Yor, M .
ANNALS OF APPLIED PROBABILITY, 2005, 15 (03) :1713-1732