Reflectance anisotropy spectroscopy of oriented films of semiconducting polymers

被引：20

作者：

Miller, EK ^{[1
]}

Hingerl, K

Brabec, CJ

Heeger, AJ

Sariciftci, NS

机构：

[1] Univ Calif Santa Barbara, Dept Phys, Santa Barbara, CA 93106 USA

[2] Univ Calif Santa Barbara, Inst Polymers & Organ Solids, Santa Barbara, CA 93106 USA

[3] Johannes Kepler Univ, Inst Phys Chem, A-4040 Linz, Austria

[4] Johannes Kepler Univ, Inst Halbleiterphys & Festkorperphys, A-4040 Linz, Austria

来源：

JOURNAL OF CHEMICAL PHYSICS | 2000年 / 113卷 / 02期

关键词：

D O I：

10.1063/1.481853

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We present reflectance anisotropy spectroscopy (RAS) data for aligned films of luminescent conjugated polymers. Ultrathin films (5-10 nm) spin-cast onto friction-deposited poly-tetrafluoroethylene (PTFE) show birefringence and dichroism indicating alignment of the polymer chains with the PTFE axis. The observed dichroism agrees very well with recently published polarized ultraviolet absorption spectra. In particular, the spectrum of a derivative of poly (para-phenylene) shows the onset of a perpendicular-polarized absorption feature at 5 eV, consistent with recent theoretical predictions. Thick films, prepared by gel-processing in polyethylene (PE), also show characteristic optical anisotropy, and the RAS results are interpreted in terms of the ellipsometric functions, Psi and Delta. (C) 2000 American Institute of Physics. [S0021-9606(00)70426-0].

引用

页码：789 / 792

页数：4

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