Analysis of XPS spectra of Fe2+ and Fe3+ ions in oxide materials

被引：5283

作者：

Yamashita, Toru ^{[1
]}

Hayes, Peter ^{[1
]}

机构：

[1] Univ Queensland, Sch Engn, Pyromet Res Ctr, Brisbane, Qld 4072, Australia

来源：

APPLIED SURFACE SCIENCE | 2008年 / 254卷 / 08期

关键词：

XPS; iron oxide; quantitative analysis; chemical state;

D O I：

10.1016/j.apsusc.2007.09.063

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Samples of the iron oxides Fe0.94O, Fe3O4, Fe2O3, and Fe2SiO4 were prepared by high temperature equilibration in controlled gas atmospheres. The samples were fractured in vacuum and high resolution XPS spectra of the fractured surfaces were measured. The peak positions and peak shape parameters of Fe 3p for Fe2+ and Fe3+ were derived from the Fe 3p XPS spectra of the standard samples of 2FeO center dot SiO2 and Fe2O3, respectively. Using these parameters, the Fe 3p peaks of Fe3O4 and Fe1-yO are analysed. The results indicate that high resolution XPS techniques can be used to determine the Fe2+/Fe3+ ratios in metal oxides. The technique has the potential for application to other transition metal oxide systems. (c) 2007 Elsevier B. V. All rights reserved.

引用

页码：2441 / 2449

页数：9

共 30 条

[1] CHARACTERIZATION OF IRON OXYGEN-SURFACE REACTIONS BY X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

ALLEN, GC ;

TUCKER, PM ;

WILD, RK .

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1982, 46 (05) :411-421

[2] A STUDY OF A NUMBER OF MIXED TRANSITION-METAL OXIDE SPINELS USING X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

ALLEN, GC ;

HARRIS, SJ ;

JUTSON, JA ;

DYKE, JM .

APPLIED SURFACE SCIENCE, 1989, 37 (01) :111-134

[3]

ATLAS S, 1995, PUBL VERLAG STAHLEIS

[4] CORE AND VALENCE LEVEL PHOTOEMISSION STUDIES OF IRON-OXIDE SURFACES AND OXIDATION OF IRON [J].

BRUNDLE, CR ;

CHUANG, TJ ;

WANDELT, K .

SURFACE SCIENCE, 1977, 68 (01) :459-468

[5]

Evans, 1966, INTRO CRYSTAL CHEM

[6]

Galasso FS., 1970, STRUCTURE PROPERTIES

[7]

Graat P, 1998, SURF INTERFACE ANAL, V26, P773, DOI 10.1002/(SICI)1096-9918(199810)26:11<773::AID-SIA419>3.0.CO

[8]

2-#

[9] Simultaneous determination of composition and thickness of thin iron-oxide films from XPS Fe 2p spectra [J].

Graat, PCJ ;

Somers, MAJ .

APPLIED SURFACE SCIENCE, 1996, 100 :36-40

[10] DECONVOLUTION AS A CORRECTION FOR PHOTOELECTRON INELASTIC ENERGY-LOSSES IN THE CORE LEVEL XPS SPECTRA OF IRON-OXIDES [J].

HAWN, DD ;

DEKOVEN, BM .

SURFACE AND INTERFACE ANALYSIS, 1987, 10 (2-3) :63-74

← 1 2 3 →