Modification of the Preston equation for the chemical-mechanical polishing of copper

被引:142
作者
Luo, Q
Ramarajan, S
Babu, SV [1 ]
机构
[1] Clarkson Univ, Dept Chem Engn, Potsdam, NY 13699 USA
[2] Clarkson Univ, Ctr Adv Mat Proc, Potsdam, NY 13699 USA
关键词
Preston equation; chemical-mechanical polishing; copper;
D O I
10.1016/S0040-6090(98)00896-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Chemical-mechanical polishing (CMP) of copper was conducted in two acidic (pH 1.3 and 3.8) slurries and one alkaline pH (10 similar to 12) slurry with alumina particles as the abrasives. In acidic media with 0.1 M Fe(NO3)(3) as a copper etchant and [1]H-benzotriazole (BTA) as an inhibitor, copper polish rate increases linearly with solids concentration in the polishing slurry. The polish rate increased linearly with increasing downward pressure and rotational speed with all of the above slurries. However, the Preston equation does not represent the polish rate data. Inclusion of an additional velocity term, representing the greater dependence of removal rate on the velocity and a constant, representing the purely chemical reactivity of the slurry which is, in general, higher than the static dip rate in the Preston equation, provided a more satisfactory representation of the data. The effect of the concentration of various slurry chemicals on the added constant term was investigated using a bench-top Struers DAP-V polisher. As expected, addition of BTA significantly reduces the Value of this constant. Also some data on polish selectivity and the effect of alumina morphology are presented. (C) 1998 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:160 / 167
页数:8
相关论文
共 33 条
[1]  
ALI I, 1994, SOLID STATE TECHNOL, P63
[2]   SOME ORGANIC-COMPOUNDS AS INHIBITORS FOR THE CORROSION OF ALUMINUM-ALLOY-6063 IN DEAERATED CARBONATE SOLUTION [J].
BAZZI, L ;
KERTIT, S ;
HAMDANI, M .
CORROSION, 1995, 51 (11) :811-817
[3]   CHEMICAL-MECHANICAL POLISHING IN SEMIDIRECT CONTACT MODE [J].
BHUSHAN, M ;
ROUSE, R ;
LUKENS, JE .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1995, 142 (11) :3845-3851
[4]   COPPER CORROSION WITH AND WITHOUT INHIBITORS [J].
BRUSIC, V ;
FRISCH, MA ;
ELDRIDGE, BN ;
NOVAK, FP ;
KAUFMAN, FB ;
RUSH, BM ;
FRANKEL, GS .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1991, 138 (08) :2253-2259
[5]  
CADIEN KC, 1994, Patent No. 5340370
[6]  
Campbell D. R., 1996, P 1 INT VMIC SPEC C, P145
[7]  
Carr J. W., 1990, Method of Chemical-Mechanical Polishing an Electronic Component Substrate and Polishing Slurry Therefor, Patent No. [4,954,142, 4954142]
[8]  
COHEN SL, 1990, J VAC SCI TECHNOL A, V8, P2317
[9]   CHEMICAL PROCESSES IN GLASS POLISHING [J].
COOK, LM .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1990, 120 (1-3) :152-171
[10]  
FANG B, 1986, SURF SCI, V176, P47