Separation of interactions by noncontact force microscopy

被引：185

作者：

Guggisberg, M ^{[1
]}

Bammerlin, M ^{[1
]}

Loppacher, C ^{[1
]}

Pfeiffer, O ^{[1
]}

Abdurixit, A ^{[1
]}

Barwich, V ^{[1
]}

Bennewitz, R ^{[1
]}

Baratoff, A ^{[1
]}

Meyer, E ^{[1
]}

Güntherodt, HJ ^{[1
]}

机构：

[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland

来源：

PHYSICAL REVIEW B | 2000年 / 61卷 / 16期

关键词：

D O I：

10.1103/PhysRevB.61.11151

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Quantitative measurements of frequency shift vs distance curves of ultrahigh-vacuum force microscopy in a noncontact mode are presented. Different contributions from electrostatic, van der Waals, and chemical interactions are determined by a systematic procedure. First, long-range electrostatic interactions are eliminated by compensating for the contact potential difference between the probing tip and the sample. Second, the long-range van der Waals contribution is determined by fitting the data for distances between 1 and 6 nm. Third, the van der Waals part is subtracted from the interaction curves. The remaining part corresponds to the shea-range chemical interaction, and is found to decrease exponentially. A Morse potential is used to fit these data. The determined parameters indicate that the interaction potential between single atoms can be measured by force microscopy in a noncontact mode.

引用

页码：11151 / 11155

页数：5

共 30 条

[1] Nonlinear dynamic behavior of an oscillating tip-microlever system and contrast at the atomic scale [J].