Anelastic spectroscopy as a selective probe to reveal and characterize spurious phases in solid compounds

被引:9
作者
Castellano, C
Cordero, F
Cantelli, R
Ferretti, M
机构
[1] Univ Roma La Sapienza, Dipartimento Fis, I-00185 Rome, Italy
[2] Unita INFM Roma 1, I-00185 Rome, Italy
[3] CNR, Ist Acust Om Corbino, I-00133 Rome, Italy
[4] Univ Genoa, Dipartimento Chim & Chim Ind, I-16146 Genoa, Italy
关键词
D O I
10.1063/1.1522487
中图分类号
O59 [应用物理学];
学科分类号
摘要
We show that it is possible, by anelastic spectroscopy measurements, to identify beyond the intrinsic limits of other techniques such as diffraction, resistivity, or extended x-ray absorption fine structure, the nature of spurious and minority phases possibly present in the experimental samples. We will stress how the high selectivity of this spectroscopy can be useful in studying classes of materials such as colossal magnetoresistance manganites or other transition metal oxides where the characterization of the specimens assumes a crucial role. (C) 2002 American Institute of Physics.
引用
收藏
页码:7206 / 7209
页数:4
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