Nano and micro mechanical measurement of interaction forces between solid surfaces

Two different types of experimental methods have been developed for measuring lateral interaction forces between two solid surfaces for nano- and micro-meter scale contacts. One is the type of direct measurement methods which typically utilize AFM instrumentations. In the direct lateral force measurements some size-scale effects are commonly observed due to the effects of adhesion and surface roughness. A recent development of a fine AFM lateral force calibration method, a diamagnetic lateral force calibrator, has made it possible to study such size-scale effects systematically. The other type is the field projection method which requires a high resolution measurement of a deformation field near the edge of a contact. For such measurements a comprehensive map of deformation measurement techniques is introduced in a domain of spatial and strain resolutions. This technique provides a way of assessing the non-uniform distribution of the surface interaction forces for nano and micro-meter scale contacts.