Concentration and temperature-dependent low-field mobility model for In0.53Ga0.47As interdigitated lateral pin PD

被引:13
作者
Menon, P. S. [1 ]
Kandiah, K. [1 ]
Shaari, S. [1 ]
机构
[1] Univ Kebangsaan Malaysia, Inst Microengn & Nanoelect IMEN, Photon Technol Lab, Bangi 43600, Selangor, Malaysia
关键词
mobility; In0.53Ga0.47As; p-i-n; photodiode; lateral; interdigitated;
D O I
10.1587/elex.5.303
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The fitted parameters for the analytic function used to specify doping- and temperature-dependent low-field mobilities for In0.53Ga0.47As is described in this paper. The developed model was compared with other mobility models as well as measured Hall data from periodical literature and very good agreement is observed. The result of this work was used to develop an In0.53Ga0.47As interdigitated lateral p-i-n photodiode (ILPP) model and good correlation was obtained when compared with the experimentally developed device. The results of this work would be useful in the development of In0.53Ga0.47As-based devices using commercial device simulation packages.
引用
收藏
页码:303 / 309
页数:7
相关论文
共 11 条
[1]   ELECTRON AND HOLE MOBILITIES IN SILICON AS A FUNCTION OF CONCENTRATION AND TEMPERATURE [J].
ARORA, ND ;
HAUSER, JR ;
ROULSTON, DJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (02) :292-295
[2]   CARRIER MOBILITIES IN SILICON EMPIRICALLY RELATED TO DOPING AND FIELD [J].
CAUGHEY, DM ;
THOMAS, RE .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1967, 55 (12) :2192-+
[3]  
CHIN WL, 1995, MICROELECTRON J, V26, P653
[4]   Simulation and design of InAlAs/InGaAs pnp heterojunction bipolar transistors [J].
Datta, S ;
Shi, S ;
Roenker, KP ;
Cahay, MM ;
Stanchina, WE .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (08) :1634-1643
[5]   IN0.53GA0.47AS INP HETEROJUNCTIONS WITH LOW INTERFACE DEFECT DENSITIES [J].
LEE, CD ;
FORREST, SR .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (01) :342-351
[6]   HIGH-PURITY IN 0.53GA0.47AS LAYER GROWN BY LIQUID-PHASE EPITAXY [J].
OHTSUKA, K ;
OHISHI, T ;
ABE, Y ;
SUGIMOTO, H ;
MATSUI, T ;
OGATA, H .
JOURNAL OF CRYSTAL GROWTH, 1988, 89 (04) :391-394
[7]   ALLOY SCATTERING EFFECTS AND CALCULATED MOBILITY IN NORMAL-TYPE GA0.47IN0.53AS [J].
PEARSALL, TP .
ELECTRONICS LETTERS, 1981, 17 (04) :169-170
[8]  
*SILVACO INT INC, 2004, ATLAS US MAN
[9]   Empirical low-field mobility model for III-V compounds applicable in device simulation codes [J].
Sotoodeh, M ;
Khalid, AH ;
Rezazadeh, AA .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (06) :2890-2900
[10]  
TAKEDA Y, 1981, ELECTRON LETT, V17, P377, DOI 10.1049/el:19810265