Optical properties of dielectric microcavities implanted with rare earth atoms

被引：7

作者：

Rigneault, H ^{[1
]}

Jacquier, B ^{[1
]}

Moretti, P ^{[1
]}

Jurdyc, AM ^{[1
]}

Belarouci, A ^{[1
]}

Auffret, A ^{[1
]}

Robert, S ^{[1
]}

机构：

[1] UNIV LYON 1,LPCML,UMR 5620,F-69622 VILLEURBANNE,FRANCE

来源：

PROCEEDINGS OF THE 13TH INTERNATIONAL CONFERENCE ON DEFECTS IN INSULATING MATERIALS - ICDIM 96 | 1997年 / 239-卷

关键词：

dielectric microcavities; rare earth in Ta2O5; radiation pattern; enhancement of fluorescence;

D O I：

10.4028/www.scientific.net/MSF.239-241.717

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Modifications of rare earth spontaneous emission implanted in a Ta2O5 layer of a planar multidielectric stack Ta2O5/SiO2 is reported. The effect of microcavity on the radiation pattern of Er3+ ions at 532nm is measured and compared to the theory. Enhancement and line narrowing of erbium and praseodymium emissions in the visible range is presented for the first time.

引用

页码：717 / 720

页数：4