Nano-welding by scanning probe microscope

被引：40

作者：

Duan, XJ ^{[1
]}

Zhang, J ^{[1
]}

Ling, X ^{[1
]}

Liu, ZF ^{[1
]}

机构：

[1] Peking Univ, Ctr Nanscale Sci & Technol, Key Lab Phys & Chem Nanoscales, Coll Chem & Mol Engn, Beijing 100871, Peoples R China

来源：

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY | 2005年 / 127卷 / 23期

关键词：

D O I：

10.1021/ja051280r

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A novel method, nano-welding, analogous to spot welding at the nanoscale level using scanning probe microscopy (SPM) is presented. Using SPM oxidation of the underlying silicon, single-walled carbon nanotubes (SWNTs) have been immobilized to the surface at point sites along their lengths by the nano-welding. It is shown that this nano-welding process nearly has no structural damage to the SWNTs. This immobilization makes the SPM manipulation of SWNTs controllable and desirable, which is helpful for the construction of SWNT-based nanodevices. Copyright © 2005 American Chemical Society.

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页码：8268 / 8269

页数：2

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