Particles shape analysis and classification using the wavelet transform

被引：30

作者：

Drolon, H ^{[1
]}

Druaux, F ^{[1
]}

Faure, A ^{[1
]}

机构：

[1] Univ Havre, IUT, GREAH, LASPA, F-76610 Le Havre, France

来源：

PATTERN RECOGNITION LETTERS | 2000年 / 21卷 / 6-7期

关键词：

particle recognition; roughness analysis; wavelet descriptors; Fourier descriptors; fractal dimension;

D O I：

10.1016/S0167-8655(00)00010-6

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

In this paper, a multiscale roughness descriptor for particles is proposed. This descriptor, based on the harmonic wavelet transform, acts as a mathematical microscope and allows analyses of wear and erosion phenomena acting on particles. The roughness descriptor is applied to a problem of sediments analysis and classification and its performances are compared with Fourier descriptors and the fractal dimension. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：473 / 482

页数：10

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