Elimination of boron memory effect in inductively coupled plasma-mass spectrometry by ammonia gas injection into the spray chamber during analysis

被引:64
作者
Al-Ammar, AS [1 ]
Gupta, RK [1 ]
Barnes, RM [1 ]
机构
[1] Univ Massachusetts, Dept Chem, Amherst, MA 01003 USA
关键词
memory effect elimination; washout time; inductively coupled plasma-mass spectrometry; boron determination;
D O I
10.1016/S0584-8547(00)00197-X
中图分类号
O433 [光谱学];
学科分类号
0703 [化学]; 070302 [分析化学];
摘要
Injection of 10-20 ml/min of ammonia gas into an inductively coupled plasma-mass spectrometry (ICP-MS) spray chamber during boron determination eliminates the memory effect of a 1 mu g/ml B solution within a 2-min washing time. Ammonia gas injection also reduces the boron blank by a factor of four and enhances the sensitivity by 33-90%. Boron detection limits are improved from 12 and 14 to 3 and 4 ng/ml, respectively, for mio ICP-MS instruments. Trace boron concentrations in certified reference materials agree well using ammonia gas injection. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:629 / 635
页数:7
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