Radiation damage of pi-nu GaAs structures

被引:5
作者
Chilingarov, A
Sloan, T
机构
[1] School of Physics and Chemistry, Lancaster University
关键词
D O I
10.1016/S0168-9002(97)01246-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The radiation damage of GaAs structures with a buried pi-v junction is investigated. The main degradation is a decrease in the charge collection efficiency. The effect of 3 x 10(14) cm(-2) 1 MeV neutrons is similar to that of 1.15 x 10(14) cm(-2) 24 GeV protons. The dark current after the irradiation converges to a saturation value as predicted by a model. Isothermal annealing up to 200 degrees C allows the charge collection efficiency to recover significantly.
引用
收藏
页码:395 / 398
页数:4
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