Micromagnetic simulation of an ultrasmall single-pole perpendicular write head

被引:20
作者
Abelmann, L
Khizroev, SK
Litvinov, D
Zhu, JG
Bain, JA
Kryder, MH
Ramstöck, K
Lodder, C
机构
[1] Univ Twente, MESA Res Inst, Informat Storage Technol Grp, NL-7500 AE Enschede, Netherlands
[2] Carnegie Mellon Univ, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA
[3] Seagate Res, Pittsburgh, PA 15222 USA
关键词
D O I
10.1063/1.372795
中图分类号
O59 [应用物理学];
学科分类号
摘要
In single-pole heads with a pole tip cross section trimmed down to 100x200 nm by focused ion beam, the remanence of the head becomes nonzero if the pole length is too high. Large-scale three-dimensional micromagnetic simulations are performed to understand this effect, and to calculate the critical length of the pole as a function of the pole tip cross section. (C) 2000 American Institute of Physics. [S0021-8979(00)87908-6].
引用
收藏
页码:6636 / 6638
页数:3
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