Electron emission from disordered tetrahedral carbon

Electron held-emission tests have been performed on films grown by a modified microwave plasma assisted chemical vapor deposition diamond process. This modification includes the addition of N-2 and O-2 during the growth stage. Characterization of these films shows the presence of a disordered tetrahedral carbon structure. Raman spectroscopy indicates a disturbance in the cubic symmetry of the lattice and x-ray diffraction indicates a disordered tetrahedral structure. Field-emission testing indicate that current densities of 0.5 mA/cm(2) can be obtained for applied fields of 5-8 V/mu m. The results are explained in terms of a change in the band structure and the formation of electronic states in the band gap. (C) 1997 American Institute of Physics.