Relation between the adhesion strength and interfacial width for symmetric polystyrene bilayers

被引:19
作者
Akabori, Kei-Ichi [1 ]
Baba, Daisuke [1 ]
Koguchi, Kazuhiro [1 ]
Tanaka, Keiji [1 ]
Nagamura, Toshihiko [1 ]
机构
[1] Kyushu Univ, Fac Engn, Dept Appl Chem, Nishi Ku, Fukuoka 8190395, Japan
关键词
adhesion; diffusion; interfaces; polystyrene;
D O I
10.1002/polb.21020
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Polystyrene (PS) bilayers were prepared and were adhered at a temperature between the surface and bulk glass-transition temperatures for a given time. Then, the interfacial adhesion strength (G(L)) was examined with a conventional lapshear measurement. G(L) first increased with increasing adhesion time and then reached a constant value. This result implied that the segments moved across the interface, to a certain depth, even at a temperature below the bulk glass-transition temperature. To confirm this, the interfacial evolution for the PS/deuterated PS bilayers was examined with dynamic secondary-ion mass spectrometry. The G(L) value was linearly proportional to the thickness of the interfacial adhesion layer. Finally, we propose a strategy for regulating the adhesion strength based on the chain-end chemistry. (c) 2006 Wiley Periodicals, Inc.
引用
收藏
页码:3598 / 3604
页数:7
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