In situ transmission electron microscopy study of electric-field-induced microcracking in single crystal Pb(Mg1/3Nb2/3)O3-PbTiO3

被引：41

作者：

Xu, Z ^{[1
]}

Tan, X ^{[1
]}

Han, P ^{[1
]}

Shang, JK ^{[1
]}

机构：

[1] Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USA

来源：

APPLIED PHYSICS LETTERS | 2000年 / 76卷 / 25期

关键词：

D O I：

10.1063/1.126765

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In this letter, we report in situ transmission electron microscopy (TEM) study of effect of a cyclic electric field on microcracking in a single crystal piezoelectric 0.66Pb(Mg1/3Nb2/3)O-3-0.34PbTiO(3). A TEM heating stage was modified to permit the in situ application of an electric field on the TEM sample surface. Microcrack initiation from a fine pore under an applied cyclic electric field was directly observed in the piezoelectric single crystal. Experimental procedures for in situ TEM studies were described. (C) 2000 American Institute of Physics. [S0003-6951(00)05125-1].

引用

页码：3732 / 3734

页数：3

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