Sliding of zinc oxide nanowires on silicon substrate

被引:27
作者
Desai, A. V. [1 ]
Haque, M. A. [1 ]
机构
[1] Penn State Univ, Dept Mech & Nucl Engn, University Pk, PA 16802 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.2431712
中图分类号
O59 [应用物理学];
学科分类号
摘要
Adhesion and friction forces between zinc oxide nanowires and silicon substrate were studied in situ inside a scanning electron microscope. A procedure for measuring these forces from the bending profiles of the nanowires was developed and the van der Waals and friction forces were found to be about 81.05 pN and 7.7 nN, respectively. The pronounced friction was explained using nanoscale adhesion-friction coupling mechanisms. Immediate implication of the findings is on the accuracy of nanomechanical characterization using bending experiments. (c) 2007 American Institute of Physics.
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页数:3
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