Genetic-algorithm-based method for optimal analog test points selection

被引：109

作者：

Golonek, T. ^{[1
]}

Rutkowski, J. ^{[1
]}

机构：

[1] Silesian Tech Univ, Inst Elect, PL-44100 Gliwice, Poland

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS | 2007年 / 54卷 / 02期

关键词：

analog circuits; analog system testing; design for testability (DfT); genetic algorithms (GAs);

D O I：

10.1109/TCSII.2006.884112

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 [电气工程]; 0809 [电子科学与技术];

摘要：

A new approach to an optimal analog test points selection is proposed. The described method uses ambiguity set concept and evolutionary computations to determine the optimal set of analog test points. After a brief introduction to analog testing and genetic algorithms, the proposed strategy is explained. The presented evolutionary approach is illustrated by a practical example of analog circuit and by a series of hypothetical circuits. The efficiency of the technique is compared with a method based on entropy index, and the obtained results are discussed.

引用

页码：117 / 121

页数：5

共 21 条

[1]

Automated selection of test frequencies for fault diagnosis in analog electronic circuits [J].