Power Device Stacking using Surface Bump Connections

被引:3
作者
Castellazzi, A. [1 ]
Mermet-Guyennet, M. [2 ]
机构
[1] Univ Nottingham, Dept Elect & Elect Engn, Nottingham NG7 2RD, England
[2] Power Electron Associated Res Lab PEARL, ALSTOM, F-65600 Semeac, France
来源
2009 21ST INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS | 2009年
关键词
MODULES;
D O I
10.1109/ISPSD.2009.5158037
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
080201 [机械制造及其自动化];
摘要
This work presents a novel integration approach for silicon power devices. Considering the very widespread half-bridge interconnection of IGBTs and anti-parallel freewheeling diodes, the first prototype development and testing of a vertically integrated switch is described. This original solution is enabled by the use of surface bumps as a replacement of bond-wires and it opens up new ways for optimum volume exploitation in power system design and also brings along double sided cooling capability and reduced stray inductance.
引用
收藏
页码:204 / +
页数:2
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