Characterization of chemical dopants in ICF targets

被引：10

作者：

Hoppe, ML ^{[1
]}

Stephens, RB ^{[1
]}

Harding, D ^{[1
]}

机构：

[1] UNIV ROCHESTER,LASER ENERGET LAB,ROCHESTER,NY 14623

来源：

FUSION TECHNOLOGY | 1997年 / 31卷 / 04期

关键词：

D O I：

10.13182/FST97-A30811

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

Capsules that contain doped GDP layers must be characterized for dopant concentration level and uniformity. X-ray mu-fluorescence (XRF), with its unique capability to quantitatively determine concentrations of most elements simultaneously and non-destructively, and in an efficient manner, is generally the method of choice for total dopant (Z>11) concentration within ICF capsules. Dopant homogeneity (as well as concentration) within the target has been determined using Rutherford Backscatter Spectroscopy (RBS). Other methods which have provided information are SEM/EDXS; combustion analyses; mass spectroscopy and thermogravimetric analysis (TGA).

引用

页码：504 / 511

页数：8