Few nanometer thick anodic porous alumina films on silicon with high density of vertical pores

被引:11
作者
Kokonou, M.
Giannakopoulos, K. P.
Nassiopoulou, A. G.
机构
[1] Demokritos Natl Ctr Sci Res, IMEL, GR-15310 Athens, Greece
[2] Demokritos Natl Ctr Sci Res, Inst Sci Mat, GR-15310 Athens, Greece
关键词
anodic porous alumina; anodization; electrochemistry; nanostructures;
D O I
10.1016/j.tsf.2006.11.022
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Anodic porous alumina films with thickness in the range of 20 to 50 nm were fabricated on a silicon substrate by electrochemistry, for use as templates for silicon nanopatteming and quantum dot growth. The atiodization conditions were investigated in detail and it was found that they differ significantly from those used to grow thicker films. Much lower electric fields were necessary, since the strong electric field causes fast dissolution of the grown alumina. Anodization was done in sulfuric or oxalic acid aqueous solutions. Due to the low anodization voltage used, high density of pores was achieved. By using the optimum anodization conditions found, anodic porous alumina films on silicon with small diameter high density vertical pores homogeneously distributed in the film were fabricated and characterized by transmission electron microscopy. (c) 2006 Elsevier B.V All rights reserved.
引用
收藏
页码:3602 / 3606
页数:5
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