Preparation and properties of TiO2-SiO2 (1:1) films prepared by a complexing agent-assisted sol-gel process

被引：20

作者：

Nishide, T ^{[1
]}

Mizukami, F ^{[1
]}

机构：

[1] NATL INST MAT & CHEM RES,TSUKUBA,IBARAKI 305,JAPAN

来源：

THIN SOLID FILMS | 1997年 / 298卷 / 1-2期

关键词：

titanium oxide; silicon dioxide; optical properties; x-ray diffraction;

D O I：

10.1016/S0040-6090(96)09140-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

TiO2-SiO2 (Ti : Si = 50 : 50 mol%) films were prepared by the sol-gel process with and without organic ligands as modulators, The effect of the ligands on the crystal structure and optical properties of the films was studied. In all samples, the anatase structure of TiO2 appeared between 500 degrees C and 700 degrees C. The crystallization temperature was not affected by the use of a ligand, but the refractive index of the films prepared with a ligand was lower than that of the films without one. The presence of a ligand is shown to be useful in controlling the optical properties of TiO2-SiO2 films. (C) 1997 Elsevier Science S.A.

引用

页码：89 / 91

页数：3

共 13 条

[1] SINGLE CRYSTAL LASER RAMAN SPECTROSCOPY [J].