Room-temperature rf magnetron sputtered ZnO for electromechanical devices

被引:40
作者
Barker, A [1 ]
Crowther, S [1 ]
Rees, D [1 ]
机构
[1] BRUNEL CTR MFG METROL,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
关键词
zinc oxide; piezoelectric thin films; rf magnetron sputtering; electromechanical devices; FILMS; GROWTH; SIO2;
D O I
10.1016/S0924-4247(96)01430-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Zinc oxide has been deposited using an r.f. magnetron sputtering system, from metallic zinc and ceramic zinc oxide targets, in an atmosphere containing 0 to 100% oxygen. Substrate temperatures from 25 to 450 degrees C have been used and several samples have been annealed in air at 430 degrees C. Coming 7059 glass and stainless-steel wafers are used as substrate materials with prior- and post-deposited aluminium as the contacting material when necessary. Characterization of these films has included scanning electron microscopy, X-ray diffraction, resistivity and dielectric measurements, The high thermal-expansion coefficient of the stainless steel dictated the need for zinc oxide deposited at low temperatures. Good dielectric films of highly oriented zinc oxide are now being produced at room temperature and have been used to drive and pick up from a resonant structure. A theory for the deposition and growth mechanisms occurring at room temperature has been proposed.
引用
收藏
页码:229 / 235
页数:7
相关论文
共 14 条
[1]   POSTDEPOSITION ANNEALING OF RF-SPUTTERED ZINC-OXIDE FILMS [J].
BEKMAN, HHPT ;
BENOIST, KW ;
JOPPE, JL .
APPLIED SURFACE SCIENCE, 1993, 70-1 :347-350
[2]  
Bever MB., 1986, ENCY MAT SCI ENG
[3]   THIN-FILM ZNO AS MICROMECHANICAL ACTUATOR AT LOW-FREQUENCIES [J].
BLOM, FR ;
YNTEMA, DJ ;
VANDEPOL, FCM ;
ELWENSPOEK, M ;
FLUITMAN, JHJ ;
POPMA, TJA .
SENSORS AND ACTUATORS A-PHYSICAL, 1990, 21 (1-3) :226-228
[4]   RF PLANAR MAGNETRON SPUTTERED ZNO FILMS .2. ELECTRICAL-PROPERTIES [J].
BLOM, FR ;
VANDEPOL, FCM ;
BAUHUIS, G ;
POPMA, TJA .
THIN SOLID FILMS, 1991, 204 (02) :365-376
[5]   THIN-FILM INDUCED STRESS IN GAAS RIDGE-WAVE-GUIDE STRUCTURES INTEGRATED WITH SPUTTER-DEPOSITED ZNO FILMS [J].
KIM, HK ;
KLEEMEIER, W ;
LI, YB ;
LANGER, DW ;
CASSIDY, DT ;
BRUCE, DM .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03) :1328-1332
[6]   ZNO FILMS DEPOSITED ON GAAS SUBSTRATES WITH A SIO2 THIN BUFFER LAYER [J].
KIM, HK ;
MATHUR, M .
JOURNAL OF ELECTRONIC MATERIALS, 1993, 22 (03) :267-273
[7]  
Mel'nichuk A. V., 1994, Physics of the Solid State, V36, P1430
[8]   HYDROTHERMAL GROWTH AND CHARACTERIZATION OF ZNO SINGLE-CRYSTALS OF HIGH-PURITY [J].
SAKAGAMI, N .
JOURNAL OF CRYSTAL GROWTH, 1990, 99 (1-4) :905-909
[9]   THERMAL-STRESSES AND CRACKING RESISTANCE OF DIELECTRIC FILMS (SIN, SI3N4, AND SIO2) ON SI SUBSTRATES [J].
SINHA, AK ;
LEVINSTEIN, HJ ;
SMITH, TE .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (04) :2423-2426
[10]   GROWTH-KINETICS OF ZNO PREPARED BY ORGANOMETALLIC CHEMICAL VAPOR-DEPOSITION [J].
SOULETIE, P ;
WESSELS, BW .
JOURNAL OF MATERIALS RESEARCH, 1988, 3 (04) :740-744