Spin-polarized low energy electron microscopy of ferromagnetic thin films

被引：25

作者：

Bauer, E ^{[1
]}

Duden, T ^{[1
]}

Zdyb, R ^{[1
]}

机构：

[1] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2002年 / 35卷 / 19期

关键词：

D O I：

10.1088/0022-3727/35/19/301

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

After a brief summary of the fundamentals, the possibilities and limitations of spin-polarized low energy electron microscopy and its application is illustrated with examples from recent work. These range from fundamental problems such as the determination of the exchange-split excited state band structure to problems of more practical interest such as the evolution of interlayer coupling with film thickness.

引用

页码：2327 / 2331

页数：5

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