Fabrication of internal diffraction gratings in planar silica plates using low-density plasma formation induced by a femtosecond laser

被引:5
作者
Cho, SH [1 ]
Kumagai, H [1 ]
Midorikawa, K [1 ]
机构
[1] RIKEN, Inst Phys & Chem Res, Laser Technol Lab, Wako, Saitama 3510198, Japan
关键词
diffraction grating; refractive index modification; plasma formation; silica plate; femtosecond laser;
D O I
10.1016/S0168-583X(02)01477-5
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The fabrication of an internal diffraction grating with photoinduced refractive index modification in planar silica plates was demonstrated using low-density plasma formation excited by a high-intensity femtosecond (150 fs) Ti:sapphire laser (lambda(p) = 790 nm). The refractive index modifications with diameters ranging from 400 nm to 3 mum were photoinduced after plasma formation occurred upon irradiation with peak intensities of more than 2 x 10(13) W/cm(2). The graded refractive index profile was fabricated to be a symmetric around from the center of the point at which low-density plasma occurred. The maximum refractive index change (Deltan) was estimated to be 1.6 x 10(-2). The. low-density plasma formation (n(c) < 1.79 x 10(27) (m(-3))) causes the refractive index modification with a SiE' center defect. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:73 / 82
页数:10
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