Development of STS markers linked to Hessian fly resistance gene H6 in wheat

被引:27
作者
Dweikat, I [1 ]
Zhang, W
Ohm, H
机构
[1] Univ Nebraska, Dept Agron & Hort, Lincoln, NE 68583 USA
[2] Purdue Univ, Dept Agron, W Lafayette, IN 47907 USA
关键词
RAPD; Triticum aestivum L; Hessian fly; STS;
D O I
10.1007/s00122-002-0946-9
中图分类号
S3 [农学(农艺学)];
学科分类号
0901 ;
摘要
Hessian fly is one of the world's most destructive insect pests of wheat Triticum aestivum L. We have used the combination of near-isogenic lines (NIL) and random amplified polymorphic DNA (RAPD) analysis to screen up to 2,000 primers to identify DNA markers that are linked to gene H6 that confers resistance to biotype B of the insect. This screen produced six primers that show polymorphic fragments associated with resistance by H6. We have screened 440 F-2 individuals from a cross of the susceptible cultivar Newton and a NIL that contains H6 to verify the linkage between these markers and the resistance gene. A high-resolution genetic map was constructed based on recombination frequency. Two of the markers were tightly linked to the gene with no recombination observed, three were within 2.0 cM, and one was 11 cM from the gene. Three of the six markers were successfully converted to sequence tagged site (STS) markers. Both RAPD and STS primers were used to screen for the presence or absence of the resistance gene in wheat varieties. The identification of markers and construction of the genetic high resolution map provide the first steps toward localization of this resistance gene.
引用
收藏
页码:766 / 770
页数:5
相关论文
共 26 条
[1]  
ALLEN RE, 1959, KANSAS AGR EXP STATI, V104, P51
[2]  
COX TS, 1994, CROP SCI, V34, P958, DOI [10.2135/cropsci1994.0011183X003400040023x, 10.2135/cropsci1994.0011183X003400020005x]
[3]   Identification of RAPD markers for 11 Hessian fly resistance genes in wheat [J].
Dweikat, I ;
Ohm, H ;
Patterson, F ;
Cambron, S .
THEORETICAL AND APPLIED GENETICS, 1997, 94 (3-4) :419-423
[4]   ASSOCIATION OF A DNA MARKER WITH HESSIAN FLY RESISTANCE GENE H9 IN WHEAT [J].
DWEIKAT, I ;
OHM, H ;
MACKENZIE, S ;
PATTERSON, F ;
CAMBRON, S ;
RATCLIFFE, R .
THEORETICAL AND APPLIED GENETICS, 1994, 89 (7-8) :964-968
[5]   PEDIGREE ASSESSMENT USING RAPD-DGGE IN CEREAL CROP SPECIES [J].
DWEIKAT, I ;
MACKENZIE, S ;
LEVY, M ;
OHM, H .
THEORETICAL AND APPLIED GENETICS, 1993, 85 (05) :497-505
[6]   The deletion stocks of common wheat [J].
Endo, TR ;
Gill, BS .
JOURNAL OF HEREDITY, 1996, 87 (04) :295-307
[7]   EFFECTIVENESS OF DEPLOYING SINGLE GENE RESISTANCES IN WHEAT FOR CONTROLLING DAMAGE BY THE HESSIAN FLY (DIPTERA, CECIDOMYIIDAE) [J].
FOSTER, JE ;
OHM, HW ;
PATTERSON, FL ;
TAYLOR, PL .
ENVIRONMENTAL ENTOMOLOGY, 1991, 20 (04) :964-969
[8]   MONOSOMIC ANALYSIS OF WHEAT FOR RESISTANCE TO HESSIAN FLY [J].
GALLUN, RL ;
PATTERSON, FL .
JOURNAL OF HEREDITY, 1977, 68 (04) :223-226
[9]   GENETIC BASIS OF HESSIAN FLY EPIDEMICS [J].
GALLUN, RL .
ANNALS OF THE NEW YORK ACADEMY OF SCIENCES, 1977, 287 (FEB25) :223-229
[10]   IDENTIFICATION OF RAPD MARKERS LINKED TO A MAJOR RUST RESISTANCE GENE BLOCK IN COMMON BEAN [J].
HALEY, SD ;
MIKLAS, PN ;
STAVELY, JR ;
BYRUM, J ;
KELLY, JD .
THEORETICAL AND APPLIED GENETICS, 1993, 86 (04) :505-512