End of Moore's law: thermal (noise) death of integration in micro and nano electronics

被引:266
作者
Kish, LB [1 ]
机构
[1] Texas A&M Univ, Dept Elect Engn, College Stn, TX 77843 USA
关键词
D O I
10.1016/S0375-9601(02)01365-8
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The exponential growth of memory size and clock frequency in computers has a great impact on everyday life. The growth is empirically described by Moore's law of miniaturization. Physical limitations of this growth would have a serious impact on technology and economy. A thermodynamical effect, the increasing thermal noise voltage (Johnson-Nyquist noise) on decreasing characteristic capacitances, together with the constrain of using lower supply voltages to keep power dissipation manageable on the contrary of increasing clock frequency, has the potential to break abruptly Moore's law within 6-8 years, or earlier. (C) 2002 Elsevier Science B.V. All rights reserved.
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页码:144 / 149
页数:6
相关论文
共 12 条
[1]  
[Anonymous], ELECTRONICS
[2]   More on Moore's law [J].
Brenner, AE .
PHYSICS TODAY, 2001, 54 (07) :84-84
[3]  
CONDRA L, UNPUB IMPACT SEMICON
[4]   Moore's law and the future of computing [J].
Fodor, I .
PHYSICS TODAY, 2000, 53 (10) :106-+
[5]  
FULLER B, 2002, EE TIMES 0312
[6]  
Kedem Benjamin, 1994, Time Series Analysis by Higher Order Crossings
[7]  
Kiss LB, 1996, AIP CONF PROC, P382, DOI 10.1063/1.51039
[8]  
NEELY L, 2002, ELECT NEWS 0710
[9]   Mathematical analysis of random noise [J].
Rice, SO .
BELL SYSTEM TECHNICAL JOURNAL, 1944, 23 :282-332
[10]   MATHEMATICAL ANALYSIS OF RANDOM NOISE [J].
RICE, SO .
BELL SYSTEM TECHNICAL JOURNAL, 1945, 24 (01) :46-156