Zero-bias anomaly of point-contact resistance due to adiabatic electron renormalization of dynamical defects

被引:19
作者
Kozub, VI
Rudin, AM
机构
[1] DELFT UNIV TECHNOL, DELFT INST MICROELECT & SUBMICRON TECHNOL, NL-2628 CJ DELFT, NETHERLANDS
[2] UNIV MINNESOTA, INST THEORET PHYS, MINNEAPOLIS, MN 55455 USA
关键词
D O I
10.1103/PhysRevB.55.259
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We study the effect of the adiabatic electron renormalization on the parameters of the dynamical defects in the ballistic metallic point contact. The upper energy states of the ''dressed'' defect are shown to make a smaller contribution to a resistance of the contact than the lower-energy ones. This holds both for the ''classical'' renormalization related to defect coupling with average local-electron density and for the ''mesoscopic'' renormalization caused by the mesoscopic fluctuations of electronic density the dynamical defects are coupled with. In the case of mesoscopic renormalization, one may treat the dynamical defect as coupled with Friedel oscillations originated by the other defects, both static and mobile. Such coupling lifts the energy degeneracy of the states of the dynamical defects making a different mesoscopic contribution to resistance, and provides a model for the fluctuator that pictures it as the object originated by the electronic mesoscopic disorder rather than by the structural one, The correlation between the defect energy and the defect contribution to the resistance leads to zero-temperature and zero-bias anomalies of the point-contact resistance. A comparison of these anomalies with those predicted by the two-channel Kondo model (TCKM) is made. It is shown, that although the proposed model is based on a completely different from TCKM physical background, it leads to a zero-bias anomalies of the point-contact resistance, which are qualitatively similar to TCKM predictions.
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页码:259 / 267
页数:9
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