Atomic force microscopy using small cantilevers

被引:25
作者
Walters, DA
Viani, M
Paloczi, GT
Schaffer, TE
Cleveland, JP
Wendman, MA
Gurley, G
Elings, V
Hansma, PK
机构
来源
MICROMACHINING AND IMAGING | 1997年 / 3009卷
关键词
atomic force microscopy; high speed; cantilevers; microfabrication; crystal growth; protein;
D O I
10.1117/12.271227
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have applied a new generation of short cantilevers with high resonant frequencies to tapping mode atomic force microscopy of a process in situ. Crystal growth in the presence of protein has been imaged stably at 79 lines/s (1.6 s/image), using a 26 mu m long cantilever with a spring constant of 0.66 N/m at a tapping frequency of 90.9 kHz. This high scan speed neatly eliminated distortion in the step edge motion and allowed imaging of finer features along the step edges. Atomic force microscopy with short cantilevers therefore allows higher resolution imaging of crystal growth in space as well as time.
引用
收藏
页码:43 / 47
页数:5
相关论文
empty
未找到相关数据