Dielectric frequency-temperature-compensated microwave whispering-gallery-mode resonators

被引：40

作者：

Tobar, ME ^{[1
]}

Krupka, J ^{[1
]}

Ivanov, EN ^{[1
]}

Woode, RA ^{[1
]}

机构：

[1] WARSAW UNIV TECHNOL, DEPT ELECT, INST MICROELECT & OPTOELECT, PL-00662 WARSAW, POLAND

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1997年 / 30卷 / 19期

关键词：

D O I：

10.1088/0022-3727/30/19/016

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In this paper we show that it is possible to annul the frequency-temperature coefficient of a sapphire dielectric resonator using another dielectric with the opposite frequency-temperature dependence. We have successfully annulled the frequency-temperature coefficient of a composite sapphire-strontium titanate (Al2O3-SrTiO3) microwave resonator at 108 K with a resulting Q factor of 20 000-50 000 below 150 K.

引用

页码：2770 / 2775

页数：6

共 15 条

[1]

CUTHBERTSON BD, 1996, IEEE MTT S INT MICR

[2]

DICK GJ, 1994, P IEEE INT FREQ CONT, P421, DOI 10.1109/FREQ.1994.398302

[3]

Kajfez D., 1986, DIELECTRIC RESONATOR

[4] DIELECTRIC-PROPERTIES OF RUTILE AND ITS USE IN HIGH-TEMPERATURE SUPERCONDUCTING RESONATORS [J].

KLEIN, N ;

ZUCCARO, C ;

DAHNE, U ;

SCHULZ, H ;

TELLMANN, N ;

KUTZNER, R ;

ZAITSEV, AG ;

WORDENWEBER, R .

JOURNAL OF APPLIED PHYSICS, 1995, 78 (11) :6683-6686

[5]

KRUPKA J, 1994, IEEE T MTT, V42

[6]

Luiten AN, 1995, PROCEEDINGS OF THE 1995 IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM, P433, DOI 10.1109/FREQ.1995.483931

[7] Structural and electrical characterization of sputter-deposited SrTiO3 thin films [J].

Madsen, LD ;

Johnson, CNL ;

Jacobsen, SN ;

Helmersson, U ;

Rudner, S ;

Ivanov, I ;

Wernlund, LD ;

Ryen, L ;

Olsson, E .

MICROELECTRONIC ENGINEERING, 1995, 29 (1-4) :123-127

[8] DIELECTRIC MICROWAVE RESONATOR [J].

OKAYA, A ;

BARASH, LF .

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1962, 50 (10) :2081-&

[9]

PANOV VI, 1986, RADIOTEKH ELEKTRON+, V31, P213

[10] LOW-TEMPERATURE ELECTRICAL-PROPERTIES OF SOME ANISOTROPIC CRYSTALS [J].

SHELBY, R ;

FONTANELLA, J .

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1980, 41 (01) :69-74

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