A method to correct defocused element distribution maps in electron probe microanalysis

被引：3

作者：

Kluckner, M ^{[1
]}

Brandl, O ^{[1
]}

Weinbruch, S ^{[1
]}

Stadermann, FJ ^{[1
]}

Ortner, HM ^{[1
]}

机构：

[1] MAX PLANCK INST POLYMER RES,D-55020 MAINZ,GERMANY

来源：

MIKROCHIMICA ACTA | 1997年 / 125卷 / 1-4期

关键词：

electron probe microanalysis; element distribution mapping;

D O I：

10.1007/BF01246188

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Element distribution maps obtained on electron microprobes via the beam scan method with wavelength-dispersive spectrometers reveal a defocusing effect if they are taken at sufficiently small magnification. This effect, which occurs where the Bragg condition of the spectrometer is not adequately met, can be avoided or corrected by various methods. A method is presented here to correct defocused element distribution maps with the help of corresponding maps obtained on homogeneous standards.

引用

页码：229 / 234

页数：6

共 9 条

[1]

GOLDSTEIN JI, 1992, SCANNING ELECTRON MI

[2] COMMENTS ON SAVITZKY-GOLAY CONVOLUTION METHOD FOR LEAST-SQUARES FIT SMOOTHING AND DIFFERENTIATION OF DIGITAL DATA [J].