PZT phase formation monitored by high-temperature X-ray diffractometry

被引：14

作者：

Babushkin, O ^{[1
]}

Lindback, T ^{[1
]}

Brooks, K ^{[1
]}

Setter, N ^{[1
]}

机构：

[1] ECOLE POLYTECH FED LAUSANNE,LAB CERAM,LAUSANNE,SWITZERLAND

来源：

JOURNAL OF THE EUROPEAN CERAMIC SOCIETY | 1997年 / 17卷 / 06期

关键词：

D O I：

10.1016/S0955-2219(96)00133-1

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The crystallisation kinetics of amorphous sol-gel PZT thin films were investigated using high-temperature X-my diffraction. Crystallisation for different isotherms was monitored as a function of time. Phase transformation data were obtained from integrated X-ray peak intensities which were calibrated based on image analysis of the surface microstructure of the samples at the end of the isothermal treatments. An activation energy of 310 kJ/mol was obtained without assuming a specific kinetic model. Front the transformation data, a TTT diagram was constructed for the ranges studied. (C) 1997 Elsevier Science Limited.

引用

页码：813 / 818

页数：6

共 12 条

[1] ORIENTATION OF RAPID THERMALLY ANNEALED LEAD-ZIRCONATE-TITANATE THIN-FILMS ON (111) PT SUBSTRATES [J].

BROOKS, KG ;

REANEY, IM ;

KLISSURSKA, R ;

HUANG, Y ;

BURSILL, L ;

SETTER, N .

JOURNAL OF MATERIALS RESEARCH, 1994, 9 (10) :2540-2553

[2]

Budd K. D., 1985, British Ceramic Proceedings, P107

[3]

GRISWOLD EM, 1995, MATER RES SOC SYMP P, V361, P389

[4] EFFECT OF HEATING RATE ON THE CRYSTALLIZATION BEHAVIOR OF AMORPHOUS PZT THIN-FILMS [J].

HU, H ;

PENG, CJ ;

KRUPANIDHI, SB .

THIN SOLID FILMS, 1993, 223 (02) :327-333

[5] EFFECT OF NB DOPING ON THE MICROSTRUCTURE OF SOL-GEL-DERIVED PZT THIN-FILMS [J].

KLISSURSKA, RD ;

BROOKS, KG ;

REANEY, IM ;

PAWLACZYK, C ;

KOSEC, M ;

SETTER, N .

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1995, 78 (06) :1513-1520

[6]

KWOK CK, 1992, CERAM T, V25, P85

[7]

Larsen P. K., 1992, P 8 IEEE INT S APPL, P217

[8]

Porter D.A., 1988, PHASE TRANSFORMATION

[9]

Rao C.N. R., 1978, PHASE TRANSITIONS SO

[10] USE OF TRANSMISSION ELECTRON-MICROSCOPY FOR THE CHARACTERIZATION OF RAPID THERMALLY ANNEALED, SOLUTION-GEL, LEAD-ZIRCONATE-TITANATE FILMS [J].

REANEY, IM ;

BROOKS, K ;

KLISSURSKA, R ;

PAWLACZYK, C ;

SETTER, N .

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1994, 77 (05) :1209-1216

← 1 2 →