Frequency metrology on the EF 1Σg+←X 1Σg+(0,0) transition in H2, HD, and D2

被引：54

作者：

Hannemann, S. ^{[1
]}

Salumbides, E. J. ^{[1
]}

Witte, S. ^{[1
]}

Zinkstok, R. T. ^{[1
]}

van Duijn, E. -J. ^{[1
]}

Eikema, K. S. E. ^{[1
]}

Ubachs, W. ^{[1
]}

机构：

[1] Vrije Univ Amsterdam, Dept Phys & Astron, Ctr Laser, NL-1081 HV Amsterdam, Netherlands

来源：

PHYSICAL REVIEW A | 2006年 / 74卷 / 06期

关键词：

D O I：

10.1103/PhysRevA.74.062514

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a frequency metrology study on the lowest rotational levels of the hydrogen EF (1)Sigma(+)(g)<- X (1)Sigma(+)(g)(0,0) two-photon transition near 202 nm. For this purpose, the fourth harmonic of an injection-seeded titanium:sapphire pulsed oscillator is employed in a Doppler-free REMPI-detection scheme on a molecular beam of hydrogen. A frequency comb laser is used to perform the absolute frequency calibration on the continuous-wave (CW) laser that injection-seeds the oscillator. Chirp-induced frequency differences between the output of the pulsed oscillator and the seeding light are monitored on-line, while possible systematic shifts related to the AC-Stark and Doppler effects are addressed in detail. The transition frequencies of the Q(0) to Q(2) lines in H-2 and D-2, and the Q(0) and Q(1) lines in HD are determined with an absolute accuracy at the 10(-9) level.

引用

页数：11

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