Refractive index of colored films of molybdenum trioxide

被引：12

作者：

Reyes-Betanzo, C

Herrera-Pérez, JL

Cocoletzi, GH

Zelaya-Angel, O

机构：

[1] Univ Autonoma Puebla, Escuela Ciencias elect, Puebla 72570, Mexico

[2] Univ Autonoma Puebla, Inst Fis, Puebla 72570, Mexico

[3] Inst Politecn Nacl, Ctr Invest Ciencia Aplicada & Tecnol Avanzada, Puebla 72160, Mexico

[4] Ohio Univ, Dept Phys & Astron, Athens, OH 45701 USA

[5] Ohio Univ, Condensed Matter & Surface Sci Program, Athens, OH 45701 USA

[6] Inst Politecn Nacl, Ctr Invest & Estudios Avanzados, Dept Fis, Mexico City 14, DF, Mexico

来源：

JOURNAL OF APPLIED PHYSICS | 2000年 / 88卷 / 01期

关键词：

D O I：

10.1063/1.373646

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We apply a film thickness-independent technique to measure the index of refraction n=n+ik for amorphous thin films of molybdenum trioxide. The films were grown by thermal evaporation and then colored by light irradiation for different exposure times. Data for the reflectivity and differential reflectivity yield n and show no dependence on the density of color centers. We find that small variations of the absorption coefficient induce changes in the differential reflectance line shape at angles different from the Brewster angle. (C) 2000 American Institute of Physics. [S0021-8979(00)01413- 4].

引用

页码：223 / 226

页数：4

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