Optical description of solid-state dye-sensitized solar cells. I. Measurement of layer optical properties

被引：38

作者：

Moule, Adam J. ^{[1
,2
]}

Snaith, Henry J. ^{[3
]}

Kaiser, Markus ^{[2
]}

Klesper, Heike ^{[2
]}

Huang, David M. ^{[1
]}

Graetzel, Michael ^{[4
]}

Meerholz, Klaus ^{[2
]}

机构：

[1] Univ Calif Davis, Davis, CA 95616 USA

[2] Univ Cologne, D-50939 Cologne, Germany

[3] Univ Oxford, Dept Phys, Clarendon Lab, Oxford OX1 3PU, England

[4] Ecole Polytech Fed Lausanne, Inst Sci & Ingn Chim, CH-1015 Lausanne, Switzerland

来源：

JOURNAL OF APPLIED PHYSICS | 2009年 / 106卷 / 07期

基金：

美国能源部;

关键词：

CHARGE SEPARATION; HIGH-EFFICIENCY; ELECTRODE;

D O I：

10.1063/1.3204982

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The efficiency of a photovoltaic device is limited by the portion of solar energy that can be captured. We discuss how to measure the optical properties of the various layers in solid-state dye-sensitized solar cells (SDSC). We use spectroscopic ellipsometry to determine the complex refractive index of each of the various layers in a SDSC. Each of the ellipsometry fits is used to calculate a transmission spectrum that is compared to a measured transmission spectrum. The complexities of pore filling on the fitting of the ellipsometric data are discussed. Scanning electron microscopy and energy dispersive x-ray spectroscopy is shown to be an effective method for determining pore filling in SDSC layers. Accurate effective medium optical constants for each layer are presented and the material limits under which these optical constants can be used are discussed. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3204982]

引用

页数：9

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