Extension of high density interconnect multichip module technology for MEMS packaging

被引:2
作者
Butler, JT
Bright, VM
Saia, RJ
Comtois, JH
机构
来源
MICROMACHINED DEVICES AND COMPONENTS III | 1997年 / 3224卷
关键词
micro-electro-mechanical systems; packaging; chip-on-flex; high density interconnect; multichip modules;
D O I
10.1117/12.284513
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we describe research into extending the General Electric (GE) Chip-on-Flex (COF) process for packaging microelectromechanical systems (MEMS). COF is a derivative of the high density interconnect (HDI) used for multichip module packaging of microelectronics. COF is a high performance, low cost multichip packaging technology in which die are encased in a molded plastic substrate and interconnects are made via a thin-film structure formed over the components. For MEMS packaging, the standard COF process has been modified to Include laser ablating windows in the interconnect overlay to allow access to MEMS. Special purpose surface and bulk micromachining test die were developed and packaged with CMOS electronics using the COF process. The COF/MEMS packaging technology is well-suited for applications in which monolithic integration of MEMS and electronics is not optimal.
引用
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页码:169 / 177
页数:9
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