Calculation of the temperature field induced in a sample by laser illuminated STM-probe

被引:13
作者
Geshev, PI
Demming, F
Jersch, J
Dickmann, K
机构
[1] FH Muenster, FB Phys Tech, Laserlab, D-48565 Steinfurt, Germany
[2] Russian Acad Sci, Inst Thermophys, Novosibirsk 630090, Russia
关键词
laser irradiation; nanostructures; scanning tunneling microscopy;
D O I
10.1016/S0040-6090(00)00652-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A finite-difference implicit numerical method of solution is applied to a problem of heat transfer calculation in a sample heated by a near field of a sharp probe tip irradiated with a short laser impulse. A thick sample occupying semi-infinite space and a thin metallic sheet attached to a thick dielectric support are considered. The calculations show that the maximal temperature of the thin metallic film is one order of magnitude larger than for the massive sample. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:156 / 162
页数:7
相关论文
共 14 条
[1]  
Banerjee P.K., 1981, BOUNDARY ELEMENT MET
[2]   Time-resolved measurements of the response of a STM tip upon illumination with a nanosecond laser pulse [J].
Boneberg, J ;
Tresp, M ;
Ochmann, M ;
Munzer, HJ ;
Leiderer, P .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (06) :615-619
[3]  
Brebbia CA., 1984, BOUNDARY ELEMENT TEC, DOI DOI 10.1007/978-3-642-48860-3
[4]   Calculation of the field enhancement on laser-illuminated scanning probe tips by the boundary element method [J].
Demming, F ;
Jersch, J ;
Dickmann, K ;
Geshev, PI .
APPLIED PHYSICS B-LASERS AND OPTICS, 1998, 66 (05) :593-598
[5]  
GESHEV PI, 1999, IN PRESS APPL PHYS B
[6]   THIN-FILM NANOPROCESSING BY LASER STM COMBINATION [J].
GORBUNOV, AA ;
POMPE, W .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1994, 145 (02) :333-338
[7]   Thermal expansion of scanning tunneling microscopy tips under laser illumination [J].
Grafstrom, S ;
Schuller, P ;
Kowalski, J ;
Newmann, R .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (07) :3453-3460
[8]   Laser-induced thermal expansion of a scanning tunneling microscope tip measured with an atomic force microscope cantilever [J].
Huber, R ;
Koch, M ;
Feldmann, J .
APPLIED PHYSICS LETTERS, 1998, 73 (17) :2521-2523
[9]   Time-resolved current response of a nanosecond laser pulse illuminated STM tip [J].
Jersch, J ;
Demming, F ;
Fedotov, I ;
Dickmann, K .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1999, 68 (06) :637-641
[10]  
KUCHLING H, 1995, TASCHENBUCH PHYSIK, P635