An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images

被引：18

作者：

Croitoru, M. D. ^{[1
]}

Van Dyck, D. ^{[1
]}

Van Aert, S. ^{[1
]}

Bals, S. ^{[1
]}

Verbeeck, J. ^{[1
]}

机构：

[1] Univ Antwerp, EMAT, B-2020 Antwerp, Belgium

来源：

ULTRAMICROSCOPY | 2006年 / 106卷 / 10期

关键词：

scanning transmission electron microscopy (STEM); thermal diffuse scattering; multislice simulation;

D O I：

10.1016/j.ultramic.2006.04.006

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We propose an improved image simulation procedure for atomic-resolution annular dark-field scanning transmission electron microscopy (STEM) based on the multislice formulation, which takes thermal diffuse scattering fully into account. The improvement with regard to the classical frozen phonon approach is realized by separating the lattice configuration statistics from the dynamical scattering so as to avoid repetitive calculations. As an example, the influence of phonon scattering on the image contrast is calculated and investigated. STEM image simulation of crystals can be applied with reasonable computing times to problems involving a large number of atoms and thick or large supercells. (c) 2006 Elsevier B.V. All rights reserved.

引用

页码：933 / 940

页数：8

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