Double photoionization of helium down to 100 meV above threshold

被引：64

作者：

Huetz, A ^{[1
]}

Mazeau, J ^{[1
]}

机构：

[1] Univ Paris 11, UMR 8624 CNRS, Lab Spect Atom & Ion, F-91405 Orsay, France

来源：

PHYSICAL REVIEW LETTERS | 2000年 / 85卷 / 03期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1103/PhysRevLett.85.530

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Double photoionization of helium has been studied using a new instrument which allows one to detect the two emitted electrons over 4 pi steradians and measure their individual momenta. The experiments have been performed at 0.2 and 0.1 eV above threshold, and both double and triple differential cross sections have been extracted. In comparison with higher energy data, the results show that the strength of angular correlation between the two electrons increases towards threshold.

引用

页码：530 / 533

页数：4

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