Raman spectroscopic evidence of thickness dependence of the doping level of electrochemically deposited polypyrrole film

被引：121

作者：

Chen, F

Shi, GQ ^{[1
]}

Fu, MX

Qu, LT

Hong, XY

机构：

[1] Tsinghua Univ, Dept Chem, Beijing 100084, Peoples R China

[2] Tsinghua Univ, Bioorgan Phosphorous Chem Lab, Beijing 100084, Peoples R China

来源：

SYNTHETIC METALS | 2003年 / 132卷 / 02期

基金：

中国国家自然科学基金;

关键词：

polypyrrole Raman spectroscopy; doping level; film thickness;

D O I：

10.1016/S0379-6779(02)00197-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this paper, we present resonance Raman spectroscopic studies on as-grown thin polypyrrole (PPy) films electrochemically deposited on flat platinum electrode surfaces by direct oxidation of pyrrole in acetonitrile. It was found that the overall features of the Raman spectra depend strongly on film thickness, mainly due to that the doping level of PPy increases during film growth process. Electrochemical and X-ray photoelectron spectroscopic (XPS) examinations have confirmed this discovery. The doping level of PPy film with a given thickness also depends on the property of supporting electrolyte. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：125 / 132

页数：8

共 37 条

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AMES SP, 1987, SYNTHETIC MET, V20, P365

[2]

[Anonymous], J ELECTROANAL CHEM

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