High resolution non-contact AFM imaging of liquids condensed onto chemically nanopatterned surfaces

被引：39

作者：

Checco, Antonio ^{[1
]}

Cai, Yuguang

Gang, Oleg

Ocko, Benjamin M.

机构：

[1] Brookhaven Natl Lab, Condensed Matter Phys & Mat Sci Dept, Upton, NY 11973 USA

[2] Brookhaven Natl Lab, Dept Phys, Upton, NY 11973 USA

[3] Brookhaven Natl Lab, Ctr Funct Nanomat, Upton, NY 11973 USA

来源：

ULTRAMICROSCOPY | 2006年 / 106卷 / 8-9期

关键词：

non-contact AFM; wetting; liquids; contact angle; line tension; chemical patterns; self-assembled monolayers;

D O I：

10.1016/j.ultramic.2005.11.009

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The wetting of ethanol and octane on chemically nanopatterned surfaces has been investigated using Atomic Force Microscopy (AFM) under controlled environmental conditions. The patterns were generated on a methyl-terminated, organic monolayer using an AFM electro-oxidation process. The subsequent wetting of the organic liquids was studied using non-contact mode AFM under equilibrium conditions with the vapor. This study of condensed nanoliquids provides the first reliable measurements of sub 100 nm liquid profile shapes. The derived contact angles give an estimate of the line tension. Published by Elsevier B.V.

引用

页码：703 / 708

页数：6

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