Site- and symmetry-projected band structure measured by resonant inelastic soft x-ray scattering

被引:38
作者
Luning, J
Rubensson, JE
Ellmers, C
Eisebitt, S
Eberhardt, W
机构
[1] Institut für Festkörperforschung, D-52425 Jülich, Forschungszentrum Jülich
来源
PHYSICAL REVIEW B | 1997年 / 56卷 / 20期
关键词
D O I
10.1103/PhysRevB.56.13147
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We demonstrate that resonant inelastic soft x-ray scattering can be used to study the electronic band structure of SiC quantitatively. Band mapping is enabled by the crystal momentum selectivity, due to conservation of momentum in the scattering process. Additionally, the dipole transition-matrix elements which govern the intensity of the absorption-emission process lead to a projection of the band states on atomic sites and local angular-momentum symmetry. This yields unique band-structure information about the spatial distribution and local symmetry character of the valence-band states. By studying a compound material we demonstrate here the full capability of this technique and we present the projection of the valence bands states of cubic SiC on local silicon (s + d) and carbon p symmetries.
引用
收藏
页码:13147 / 13150
页数:4
相关论文
共 16 条
[1]   Soft X-ray emission spectra and band structure in cubic boron nitride [J].
Agui, A ;
Shin, S ;
Fujisawa, M ;
Tezuka, Y ;
Ishii, T ;
Mishima, O ;
Era, K ;
Shigemasa, E ;
Yagishita, A .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1996, 79 :191-194
[2]   Core Hole effects in resonant inelastic x-ray scattering of graphite [J].
Bruhwiler, PA ;
Kuiper, P ;
Eriksson, O ;
Ahuja, R ;
Svensson, S .
PHYSICAL REVIEW LETTERS, 1996, 76 (10) :1761-1761
[3]   PROBING THE GRAPHITE BAND-STRUCTURE WITH RESONANT SOFT-X-RAY FLUORESCENCE [J].
CARLISLE, JA ;
SHIRLEY, EL ;
HUDSON, EA ;
TERMINELLO, LJ ;
CALLCOTT, TA ;
JIA, JJ ;
EDERER, DL ;
PERERA, RCC ;
HIMPSEL, FJ .
PHYSICAL REVIEW LETTERS, 1995, 74 (07) :1234-1237
[4]   CALCULATIONS OF X-RAY EMISSION BANDS OF COPPER USING AUGMENTED PLANE WAVE BLOCH FINCTIONS [J].
GOODINGS, DA ;
HARRIS, R .
JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS, 1969, 2 (10) :1808-&
[5]   Resonant fluorescence emission from the Ge and Cu valence band [J].
Kaprolat, A ;
Schulke, W .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1997, 65 (02) :169-172
[6]   FIRST RESULTS FROM THE HIGH-RESOLUTION XUV UNDULATOR BEAMLINE BW3 AT HASYLAB [J].
LARSSON, CUS ;
BEUTLER, A ;
BJORNEHOLM, O ;
FEDERMANN, F ;
HAHN, U ;
RIECK, A ;
VERBIN, S ;
MOLLER, T .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1994, 337 (2-3) :603-608
[7]   INVESTIGATION OF THE ELECTRONIC-TRANSITIONS OF CUBIC SIC [J].
LOGOTHETIDIS, S ;
POLATOGLOU, HM ;
PETALAS, J ;
FUCHS, D ;
JOHNSON, RL .
PHYSICA B, 1993, 185 (1-4) :389-393
[8]   SOFT-X-RAY RESONANT INELASTIC-SCATTERING AT THE CK EDGE OF DIAMOND [J].
MA, Y ;
WASSDAHL, N ;
SKYTT, P ;
GUO, J ;
NORDGREN, J ;
JOHNSON, PD ;
RUBENSSON, JE ;
BOSKE, T ;
EBERHARDT, W ;
KEVAN, SD .
PHYSICAL REVIEW LETTERS, 1992, 69 (17) :2598-2601
[9]   BAND-STRUCTURE EFFECTS IN THE EXCITATION-ENERGY DEPENDENCE OF SI L2,3 X-RAY-EMISSION SPECTRA [J].
MIYANO, KE ;
EDERER, DL ;
CALLCOTT, TA ;
OBRIEN, WL ;
JIA, JJ ;
ZHOU, L ;
DONG, QY ;
MA, Y ;
WOICIK, JC ;
MUELLER, DR .
PHYSICAL REVIEW B, 1993, 48 (03) :1918-1920
[10]   Angle-resolved resonant photoemission as a probe of spatial localization and character of electron states [J].
Molodtsov, SL ;
Richter, M ;
Danzenbacher, S ;
Wieling, S ;
Steinbeck, L ;
Laubschat, C .
PHYSICAL REVIEW LETTERS, 1997, 78 (01) :142-145