Traversal time in Josephson junctions

被引:8
作者
Fabeni, P [1 ]
Mugnai, D
Pazzi, GP
Pignatelli, F
Ranfagni, A
Cristiano, R
Frunzio, L
Schulman, LS
机构
[1] CNR, Ist Ric Onde Elettromagnet Nello Carrara, I-50127 Florence, Italy
[2] CNR, Ist Cibernet, I-80125 Naples, Italy
[3] Clarkson Univ, Dept Phys, Potsdam, NY USA
来源
JOURNAL OF SUPERCONDUCTIVITY | 1999年 / 12卷 / 06期
关键词
tunneling; superconducting devices;
D O I
10.1023/A:1007753514180
中图分类号
O59 [应用物理学];
学科分类号
摘要
Direct measurements of the lifetime of the zero-voltage state in a Josephson junction, operating at a temperature where the quantum contribution is comparable with the thermal escape, have been performed as a function of the bias current [1]. From these measurements the traversal time of the barrier can be deduced according to a semiclassical analysis, analogously to what was previously done by measuring the dependence of the lifetime on the load of the junction [2]. The semiclassical traversal time, which turns out to be on the order of 100 ps, is presumably only the imaginary part of a complex quantity whose real part remains unknown (and is also not accessible to direct measurement). An estimate of this quantity can be done along the lines of a theoretical model which considers tunneling to be a stochastic process, anti the real part of the traversal time turns out to be on the order of a few picoseconds. The connection with the Zeno time is also considered.
引用
收藏
页码:829 / 833
页数:5
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