Laser-induced ion emission from dielectrics

被引：34

作者：

Henyk, M ^{[1
]}

Mitzner, R ^{[1
]}

Wolfframm, D ^{[1
]}

Reif, J ^{[1
]}

机构：

[1] Brandenburg Tech Univ Cottbus, LS Exp Phys 2, D-03044 Cottbus, Germany

来源：

APPLIED SURFACE SCIENCE | 2000年 / 154卷

关键词：

mass spectrometry; ultrashort laser pulses; laser ablation; Coulomb explosion;

D O I：

10.1016/S0169-4332(99)00377-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Photo-ablation of sapphire by ultrashort laser pulses was investigated by time-of-flight mass spectrometry. Experiments were performed on a laser fluence range below the single shot damage threshold. The dependence of emitted positive ion intensity on both the laser fluence and the number of laser pulses, hitting the same target site, was studied. In addition, the ion kinetic energy distribution was analysed. We find that the ablation is caused by surface explosion. The origin of this explosion, however, is still unknown. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：249 / 255

页数：7

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