Present developments in high-resolution transmission electron microscopy

被引：13

作者：

Ernst, F

Ruhle, M

机构：

[1] Max-Planck-Inst. fur Metallforschung, Seestraße 92, 70174, Stuttgart

来源：

CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE | 1997年 / 2卷 / 04期

关键词：

D O I：

10.1016/S1359-0286(97)80092-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

High-resolution transmission electron microscopy (HRTEM) now approaches a resolution of 1 Angstrom, combining recent instrumental developments with innovative strategies of imaging and image processing. Moreover, HRTEM has become a truly 'quantitative' technique that enables one to retrieve the atomistic structure of materials with high and well-known reliability. At the same time, HRTEM has found new applications: plan-view imaging of the atom configuration at reconstructed crystal surfaces; and atomistic in situ observation of diffusion reactions and defect kinetics in solids.

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页码：469 / 476

页数：8

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